Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...

Semiconductor process engineers have always understood the need to inspect silicon wafers to identify defects and eliminate them at their source. To simplify the process, semiconductor equipment ...

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...

“The eDR-7000 offers the opportunity to thoroughly understand the defect population on the wafer,” said Cecelia Campochiaro, Ph.D., vice president and general manager of KLA-Tencor's e-Beam Technology ...

(MENAFN- PR Newswire) "Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive," said Microtronic CEO Reiner Fenske in making the ...

According to news reports, Samsung and TSMC are expected to enter 5nm process mass production in 2020. The competition in 5nm wafer yield and market share will be very intense. A brand new wafer ...

US firm claims defect free silicon wafersNews from E-InSiteMEMC Electronic Materials announced it has begun volume production of what it claims is a defect-free silicon wafer.The US company’s wafer ...

HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...